Minitest1100涂層測厚儀配不同探頭可測量以下覆層(覆層包括涂層,鍍層等):
Minitest1100涂層測厚儀-探頭參數(shù):
探頭 |
量程 |
低端 |
誤差 |
zui小曲率半徑 |
zui小測量 |
zui小基 |
探頭尺寸 |
|
磁 |
F05 |
0-500μm |
0.1μm |
±(1%±0.7μm) |
1/5mm |
3mm |
0.2mm |
φ15x62mm |
F1.6 |
0-1600μm |
0.1μm |
±(1%±1μm) |
1.5/10mm |
5mm |
0.5mm |
φ15x62mm |
|
F1.6/90 |
0-1600μm |
0.1μm |
±(1%±1μm) |
平面/6mm |
5mm |
0.5mm |
φ8x8x170mm |
|
F2/90 |
0-2000μm |
0.2μm |
±(1%±1μm) |
平面/6mm |
5mm |
0.5mm |
φ8x8x170mm |
|
F3 |
0-3000μm |
0.2μm |
±(1%±1μm) |
1.5/10mm |
5mm |
0.5mm |
φ15x62mm |
|
F10 |
0-10mm |
5μm |
±(1%±10μm) |
5/16mm |
20mm |
1mm |
φ25x46mm |
|
F20 |
0-20mm |
10μm |
±(1%±10μm) |
10/30mm |
40mm |
2mm |
φ40x66mm |
|
F50 |
0-50mm |
10μm |
±(3%±50μm) |
50/200mm |
300mm |
2mm |
φ45x70mm |
|
兩 |
FN1.6 |
0-1600μm |
0.1μm |
±(1%±1μm) |
1.5/10mm |
5mm |
F0.5mm/N50μm |
φ15x62mm |
FN1.6P |
0-1600μm |
0.1μm |
±(1%±1μm) |
平面 |
30mm |
F0.5mm/N50μm |
φ21x89mm |
|
FN2 |
0-2000μm |
0.2μm |
±(1%±1μm) |
1.5/10mm |
5mm |
F0.5mm/N50μm |
φ15x62mm |
|
電 |
N02 |
0-200μm |
0.1μm |
±(1%±0.5μm) |
1/10mm |
2mm |
50μm |
φ16x70mm |
N.08Cr |
0-80μm |
0.1μm |
±(1%±1μm) |
2.5mm |
2mm |
100μm |
φ15x62mm |
|
N1.6 |
0-1600μm |
0.1μm |
±(1%±1μm) |
1.5/10mm |
2mm |
50μm |
φ15x62mm |
|
N1.6/90 |
0-1600μm |
0.1μm |
±(1%±1μm) |
平面/10mm |
5mm |
50μm |
φ13x13x170mm |
|
N2 |
0-2000μm |
0.2μm |
±(1%±1μm) |
1.5/10mm |
5mm |
50μm |
φ15x62mm |
|
N2/90 |
0-2000μm |
0.2μm |
±(1%±1μm) |
平面/10mm |
5mm |
50μm |
φ13x13x170mm |
|
N10 |
0-10mm |
10μm |
±(1%±25μm) |
25/100mm |
50mm |
50μm |
φ60x50mm |
|
N20 |
0-20mm |
10μm |
±(1%±50μm) |
25/100mm |
70mm |
50μm |
φ65x75mm |
|
N100 |
0-100mm |
100μm |
±(1%±0.3mm) |
100mm/平面 |
200mm |
50μm |
φ126x155mm |
|
CN02 |
10-200μm |
0.2μm |
±(1%±1μm) |
平面 |
7mm |
無限制 |
φ17x80mm |
F1.6/90、F2/90、N1.6/90、N2/90為直角探頭,用于管內(nèi)測量。
N.08Cr適合銅上鉻,F(xiàn)N2也適合銅上鉻。
CN02用于絕緣體上的有色金屬覆層。